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1

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - Full-field wafer warpage measurement technique

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Hsieh, H. L., Lee, J. Y., Huang, Y. G., Liang, A. J., Sun, B. Y.

Year:

2017

Language:

english

File:

PDF, 581 KB

english, 2017

2

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Comparison of Michelson and Linnik interference microscopes with respect to measurement capabilities and adjustment efforts

Kühnhold, Peter, Lehmann, Peter H., Osten, Wolfgang, Xie, Weichang, Lehmann, Peter, Albertazzi, Armando

Year:

2013

Language:

english

File:

PDF, 1.13 MB

english, 2013

3

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - An optical flow-based method for velocity field of fluid flow estimation

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Głomb, Grzegorz, Świrniak, Grzegorz, Mroczka, Janusz

Year:

2017

Language:

english

File:

PDF, 446 KB

english, 2017

4

SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil (Monday 13 September 2010)] Speckle 2010: Optical Metrology - Optical metrology: from the laboratory to the real world

Osten, W., Garbusi, E., Fleischle, D., Lyda, W., Pruss, C., Reichle, R., Falldorf, C., Albertazzi Goncalves, Jr., Armando, Kaufmann, Guillermo H.

Year:

2010

Language:

english

File:

PDF, 8.93 MB

english, 2010

5

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Turbine-blade tip clearance and tip timing measurements using an optical fiber bundle sensor

Garcia, Iker, Lehmann, Peter H., Osten, Wolfgang, Beloki, Josu, Zubia, Joseba, Albertazzi, Armando, Durana, Gaizka, Aldabaldetreku, Gotzon

Year:

2013

Language:

english

File:

PDF, 574 KB

english, 2013

6

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Static and (quasi)dynamic calibration of stroboscopic scanning white light interferometer

Seppä, Jeremias, Lehmann, Peter H., Osten, Wolfgang, Kassamakov, Ivan, Nolvi, Anton, Albertazzi, Armando, Heikkinen, Ville, Paulin, Tor, Lassila, Antti, Hao, Ling, Hæggsröm, Edward

Year:

2013

Language:

english

File:

PDF, 1.09 MB

english, 2013

7

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Design of omnidirectional camera lens system with catadioptic system

Jo, Jae Heung, Lehmann, Peter H., Osten, Wolfgang, Lee, Sangon, Seo, Hyeon Jin, Albertazzi, Armando, Lee, Jung Hwan, Kim, Joon Mo

Year:

2013

Language:

english

File:

PDF, 457 KB

english, 2013

8

Trinocular stereo system with object space oriented correlation for inner pipe inspection

Haertel, Maryah Elisa Morastoni, da Costa Pinto, Tiago Loureiro Figaro, Gonçalves Júnior, Armando Albertazzi

Journal:

Year:

2015

Language:

english

File:

PDF, 2.81 MB

english, 2015

9

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Monitoring industrial facilities using principles of integration of fiber classifier and local sensor networks

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Korotaev, Valery V., Denisov, Victor M., Rodrigues, Joel J. P. C., Serikova, Mariya G., Timofeev, Andrey V.

Year:

2015

Language:

english

File:

PDF, 270 KB

english, 2015

10

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Light scattering and transmission measurement using digital imaging for online analysis of constituents in milk

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Jain, Pranay, Sarma, Sanjay E.

Year:

2015

Language:

english

File:

PDF, 1.27 MB

english, 2015

11

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - System for deflection measurements of floating dry docks

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Gorbachev, Alexey A., Pantyushin, Anton V., Serikova, Mariya G., Korotaev, Valery V., Timofeev, Aleksandr N.

Year:

2015

Language:

english

File:

PDF, 540 KB

english, 2015

12

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Nanometrology of periodic nanopillar arrays by means of light scattering

Paul, Oliver, Lehmann, Peter H., Osten, Wolfgang, Widulle, Frank, Kleemann, Bernd H., Albertazzi, Armando, Heinrich, Andreas

Year:

2013

Language:

english

File:

PDF, 713 KB

english, 2013

13

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Optical profilometer using laser based conical triangulation for inspection of inner geometry of corroded pipes in cylindrical coordinates

Buschinelli, Pedro D. V., Lehmann, Peter H., Osten, Wolfgang, Melo, João Ricardo C., Albertazzi, Armando, Albertazzi, Armando, Santos, João M. C., Camerini, Claudio S.

Year:

2013

Language:

english

File:

PDF, 2.31 MB

english, 2013

14

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Interferometry XVIII - Self-mixing grating interferometer: theoretical analysis and experimental observations

Creath, Katherine, Burke, Jan, Albertazzi Gonçalves, Armando, Guo, Dongmei, Wang, Ming, Hao, Hui

Year:

2016

Language:

english

File:

PDF, 279 KB

english, 2016

15

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - Direct fabrication of polymer micro-lens array

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Coppola, S., Pagliarulo, V., Vespini, V., Nasti, G., Olivieri, F., Grilli, S., Ferraro, P.

Year:

2017

Language:

english

File:

PDF, 506 KB

english, 2017

16

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - Digital holographic inspection for drying processes of paint films and ink dots

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Yokota, M., Aoyama, F.

Year:

2017

Language:

english

File:

PDF, 836 KB

english, 2017

17

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - Experimental comparison of photogrammetry for additive manufactured parts with and without laser speckle projection

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Sims-Waterhouse, D., Bointon, P., Piano, S., Leach, R. K.

Year:

2017

Language:

english

File:

PDF, 737 KB

english, 2017

18

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - A flexible 3D laser scanning system using a robotic arm

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Fei, Zixuan, Zhou, Xiang, Gao, Xiaofei, Zhang, Guanliang

Year:

2017

Language:

english

File:

PDF, 457 KB

english, 2017

19

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - High-power LED light sources for optical measurement systems operated in continuous and overdriven pulsed modes

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Stasicki, Bolesław, Schröder, Andreas, Boden, Fritz, Ludwikowski, Krzysztof

Year:

2017

Language:

english

File:

PDF, 4.23 MB

english, 2017

20

Improved impact damage characterisation in CFRP samples using the fusion of optical lock-in thermography and optical square-pulse shearography images

de Oliveira, Bernardo C.F., Nienheysen, Philipp, Baldo, Crhistian R., Gonçalves, Armando Albertazzi, Schmitt, Robert H.

Journal:

NDT & E International

Year:

2020

Language:

english

File:

PDF, 4.00 MB

english, 2020

21

Regular mesh measurement of large free form surfaces using stereo vision and fringe projection

Tiago Pinto, Christian Kohler, Armando Albertazzi

Journal:

Optics and Lasers in Engineering

Year:

2012

Language:

english

File:

PDF, 858 KB

english, 2012

22

Mechanical stress measurement by an achromatic optical digital speckle pattern interferometry strain sensor with radial in-plane sensitivity: experimental comparison with electrical strain gauges

Viotti, Matias R., Albertazzi G., Jr., Armando, Kapp, Walter A.

Journal:

Year:

2011

Language:

english

File:

PDF, 1.09 MB

english, 2011

23

Measurement of residual stresses using local heating and a radial in-plane speckle interferometer

Albertazzi, Armando

Journal:

Optical Engineering

Year:

2005

Language:

english

File:

PDF, 905 KB

english, 2005

24

Swarm-based algorithm for phase unwrapping

da Silva Maciel, Lucas, Albertazzi, Armando G.

Journal:

Year:

2014

Language:

english

File:

PDF, 900 KB

english, 2014

25

Compact sensor combining digital speckle pattern interferometry and the hole-drilling technique to measure nonuniform residual stress fields

Viotti, Matías R., Albertazzi, Armando

Journal:

Optical Engineering

Year:

2013

Language:

english

File:

PDF, 2.31 MB

english, 2013

26

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - 3D shape shearography with integrated structured light projection for strain inspection of curved objects

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Anisimov, Andrei G., Groves, Roger M.

Year:

2015

Language:

english

File:

PDF, 1000 KB

english, 2015

27

SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil (Monday 13 September 2010)] Speckle 2010: Optical Metrology - Speckle metrology in the nanoworld, as it is perceived today, and how it may affect industry

Pryputniewicz, Ryszard J., Albertazzi Goncalves, Jr., Armando, Kaufmann, Guillermo H.

Year:

2010

Language:

english

File:

PDF, 10.86 MB

english, 2010

28

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Tape measuring system using linear encoder and digital camera

Eom, Tae Bong, Lehmann, Peter H., Osten, Wolfgang, Jeong, Don Young, Kim, Myung Soon, Albertazzi, Armando, Kim, Jae Wan, Kim, Jong Ahn

Year:

2013

Language:

english

File:

PDF, 647 KB

english, 2013

29

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Enhanced adjustment methods for optical rotary encoders

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Smirnov, Nikolai V., Latyev, Svjatoslav M., Theska, René

Year:

2015

Language:

english

File:

PDF, 1.08 MB

english, 2015

30

SPIE Proceedings [SPIE Laser Metrology for Precision Management and Inspection in Industry - Florianopolis, Brazil (Thursday 22 February 2001)] Laser Metrology for Precision Measurement and Inspection in Industry - Interferometric method for in-situ characterization of coating industrial processes

Michels, Alexandre F., Horowitz, Flavio, Albertazzi, Jr., Armando

Year:

2001

Language:

english

File:

PDF, 506 KB

english, 2001

31

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - A new class of wide-field objectives for 3D interference microscopy

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, de Groot, Peter J., Biegen, James F.

Year:

2015

Language:

english

File:

PDF, 8.83 MB

english, 2015

32

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Infrared differential interference contrast microscopy for overlay metrology on 3D-interconnect bonded wafers

Ku, Yi-sha, Lehmann, Peter H., Osten, Wolfgang, Shyu, Deh-Ming, Lin, Yeou-Sung, Albertazzi, Armando, Cho, Chia-Hung

Year:

2013

Language:

english

File:

PDF, 432 KB

english, 2013

33

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Multi-scale roughness measurement of cementitious materials using different optical profilers and window resizing analysis

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Montgomery, Paul C., Salzenstein, Fabien, Gianto, Gianto, Apedo, Komla L., Serres, Nicolas, Fond, Christophe, Feugeas, Françoise

Year:

2015

Language:

english

File:

PDF, 3.76 MB

english, 2015

34

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - 3D shape measurements with a single interferometric sensor for in-situ lathe monitoring

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Kuschmierz, R., Huang, Y., Czarske, J., Metschke, S., Löffler, F., Fischer, A.

Year:

2015

Language:

english

File:

PDF, 1.80 MB

english, 2015

35

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Principal component analysis based carrier removal approach for Fourier transform profilometry

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Feng, Shijie, Chen, Qian, Zuo, Chao

Year:

2015

Language:

english

File:

PDF, 452 KB

english, 2015

36

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Shape reconstruction using dual wavelength digital holography and speckle movements

Khodadad, Davood, Lehmann, Peter H., Osten, Wolfgang, Hällstig, Emil, Sjödahl, Mikael, Albertazzi, Armando

Year:

2013

Language:

english

File:

PDF, 1014 KB

english, 2013

37

SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Development and application of a photogrammetric endoscopic system for measurement of misalignment and internal profile of welded joints in pipelines

Albertazzi G., Jr., Armando, Lehmann, Peter H., Hofmann, Allan C., Fantin, Analucia V., Santos, João M. C.

Year:

2009

Language:

english

File:

PDF, 1.08 MB

english, 2009

38

SPIE Proceedings [SPIE Speckle06: Speckles, From Grains to Flowers - Nimes, France (Wednesday 13 September 2006)] Speckle06: Speckles, From Grains to Flowers - Configurations and applications of electronic speckle pattern interferometry for radial metrology using conical mirrors

Albertazzi G., Jr., Armando, Slangen, Pierre, Cerruti, Christine

Year:

2006

Language:

english

File:

PDF, 660 KB

english, 2006

39

SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil (Monday 13 September 2010)] Speckle 2010: Optical Metrology - Doppler phase-shift digital holography and two-wavelength interferometry

Yatagai, Toyohiko, Albertazzi Goncalves, Jr., Armando, Kaufmann, Guillermo H., Barada, Daisuke

Year:

2010

Language:

english

File:

PDF, 1.45 MB

english, 2010

40

SPIE Proceedings [SPIE Laser Metrology for Precision Management and Inspection in Industry - Florianopolis, Brazil (Thursday 22 February 2001)] Laser Metrology for Precision Measurement and Inspection in Industry - Comparison of strain/stress measurements on free form surfaces using ESPI and strain gauge technique

de Lemos, Juliano, Mischo, Horst K., Pfeifer, Tilo, Albertazzi, Jr., Armando

Year:

2001

Language:

english

File:

PDF, 926 KB

english, 2001

41

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Interferometry XVIII - Mechanical design optimization of a single-axis MOEMS accelerometer based on a grating interferometry cavity for ultrahigh sensitivity

Creath, Katherine, Burke, Jan, Albertazzi Gonçalves, Armando, Lu, Qianbo, Bai, Jian, Wang, Kaiwei, Lou, Shuqi, Jiao, Xufen, Han, Dandan, Yang, Guoguang

Year:

2016

Language:

english

File:

PDF, 857 KB

english, 2016

42

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Interferometry XVIII - Determination of the paraxial focal length of strong focusing lenses using Zernike polynomials in simulation and measurement

Creath, Katherine, Burke, Jan, Albertazzi Gonçalves, Armando, Binkele, Tobias, Hilbig, David, Fleischmann, Friedrich, Henning, Thomas

Year:

2016

Language:

english

File:

PDF, 698 KB

english, 2016

43

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Interferometry XVIII - A method for the analysis and data reduction from Hartmann and Shack-Hartmann tests

Creath, Katherine, Burke, Jan, Albertazzi Gonçalves, Armando, Gantes Nuñez, Fco. Javier, Malacara Hernández, Zacarías, Malacara Hernández, Daniel

Year:

2016

Language:

english

File:

PDF, 616 KB

english, 2016

44

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Interferometry XVIII - Dual-phase-shift schemes for internal-reflection noise reduction in a Fizeau interferometer

Creath, Katherine, Burke, Jan, Albertazzi Gonçalves, Armando, Kumagai, Toshiki, Hibino, Kenichi, Nagaike, Yasunari

Year:

2016

Language:

english

File:

PDF, 418 KB

english, 2016

45

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - Development of metrology for freeform optics in reflection mode

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Burada, Dali R., Pant, Kamal K., Mishra, Vinod, Bichra, Mohamed, Khan, Gufran S., Sinzinger, Stefan, Shakher, Chandra

Year:

2017

Language:

english

File:

PDF, 805 KB

english, 2017

46

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - Evaluation of refocus criteria for holographic particle imaging

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Picart, Pascal, Kara Mohammed, Soumaya, Bouamama, Larbi, Bahloul, Derradji

Year:

2017

Language:

english

File:

PDF, 460 KB

english, 2017

47

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - Measuring horizontal atmospheric turbulence at ground level from optical turbulence generator (OTG) using a 1D sensor

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Tíjaro Rojas, Omar J., Torres Moreno, Yezid, Rhodes, William T.

Year:

2017

Language:

english

File:

PDF, 373 KB

english, 2017

48

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - Vibration compensated high-resolution scanning white-light Linnik-interferometer

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Tereschenko, Stanislav, Lehmann, Peter, Gollor, Pascal, Kuehnhold, Peter

Year:

2017

Language:

english

File:

PDF, 631 KB

english, 2017

49

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - Non-destructive testing of layer-to-layer fusion of a 3D print using ultrahigh resolution optical coherence tomography

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Israelsen, Niels M., Maria, Michael, Feuchter, Thomas, Podoleanu, Adrian, Bang, Ole

Year:

2017

Language:

english

File:

PDF, 8.61 MB

english, 2017

50

Experimental comparison between a portable DSPI device with diffractive optical element and a hole drilling strain gage combined system

Matias R. Viotti, Armando G. Albertazzi Jr., Walter Kapp

Journal:

Optics and Lasers in Engineering

Year:

2008

Language:

english

File:

PDF, 869 KB

english, 2008

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